This file was created by the TYPO3 extension bib --- Timezone: CEST Creation date: 2024-04-25 Creation time: 10-48-30 --- Number of references 6 conference 2008-ntms-samad-RFID 2008 11 5 1-5 Online IEEE 2nd International Conference on New Technologies, Mobility, and Security (NTMS 2008), Tangier, Morocco Tangier, Morocco International Conference on New Technologies, Mobility and Security 5-7 Nov. 2008 en 978-2-9532443-0-4 FahadSamad SadeqAli Makram inproceedings 2008-sensys-sasnauskas-kleenet 2008 11 425--426 We present KleeNet, a Klee based bug hunting tool for sensor network applications before deployment. KleeNet automatically tests code for all possible inputs, ensures memory safety, and integrates well into TinyOS based application development life cycle, making it easy for developers to test their applications. bug finding, memory safety, tinyos, type safety kleenet fileadmin/papers/2008/2008-11-Sasnauskas-SenSys08-KleeNet.pdf Print ACM

New York, NY, USA

Proceedings of the 6th ACM conference on Embedded network sensor systems (SenSys'08), Raleigh, NC, USA en 978-1-59593-990-6 http://doi.acm.org/10.1145/1460412.1460485 1 RaimondasSasnauskas Jó AgilaBitsch Link Muhammad HamadAlizai KlausWehrle techreport 2008-fgsn-sasnauskas-kleenet 2008 9 Testing sensor network applications is an essential and a difficult task. Due to their distributed and faulty nature, severe resource constraints, unobservable interactions, and limited human interaction, sensor networks, make monitoring and debugging of applications strenuous and more challenging. In this paper we present KleeNet - a Klee based platform independent bug hunting tool for sensor network applications before deployment - which can automatically test applications for all possible inputs, and hence, ensures memory safety for TinyOS based applications. Upon finding a bug, KleeNet generates a concrete test case with real input values identifying a specific error path in a program. Additionally, we show that KleeNet integrates well into TinyOS application development life cycle with minimum manual effort, making it easy for developers to test their applications. kleenet fileadmin/papers/2008/2008-09-Sasnauskas-FGSN08-BugHunting.pdf ftp://ftp.inf.fu-berlin.de/pub/reports/tr-b-08-12.pdf Print Freie Universität Berlin, Institute of Computer Science

Berlin, Germany

Proceedings of the 7th GI/ITG Fachgespraech Wireless Sensor Networks, Berlin, Germany Chair of Communication and Distributed Systems (ComSys) en 1 RaimondasSasnauskas Jó AgilaBitsch Link Muhammad HamadAlizai KlausWehrle techreport 2008-fgsn-alizai-stle 2008 7 27-30 wld fileadmin/papers/2008/2008-08-alizai-fgsn-stle.pdf ftp://ftp.inf.fu-berlin.de/pub/reports/tr-b-08-12.pdf Print Fachbereich Mathematik und Informatik

Berlin, Germany

Proceedings of the 7th GI/ITG Workshop on Wireless Sensor Networks FGSN 08 September 2010 en 1 Muhammad HamadAlizai OlafLandsiedel KlausWehrle AlexanderBecher inbook 2008-thissen-LNCS-multimedia 2008 268-299 Print M. Nagl, W. Marquardt Springer Lecture Notes in Computer Science 4970 Collaborative and Distributed Chemical Engineering, From Understanding to Substantial Design Process Support en 978-3-540-70551-2 AndréSchüppen OttoSpaniol DirkThißen IngoAssenmacher EdmundHaberstroh ThorstenKuhlen inproceedings 200804landsiedelIPSN08TimingMatters 2008 344-354 The rising complexity of data processing algorithms in sensor networks combined with their severely limited computing power necessitates an in-depth understanding of their temporal behavior. However, today only cycle accurate emulation and test-beds provide a detailed and accurate insight into the temporal behavior of sensor networks. In this paper we introduce fine grained, automated instrumentation of simulation models with cycle counts derived from sensor nodes and application binaries to provide detailed timing information. The presented approach bridges the gap between scalable but abstracting simulation and cycle accurate emulation for sensor network evaluation. By mapping device-specific code with simulation models, we can derive the time and duration a certain code line takes to get executed on a sensor node. Hence, eliminating the need to use expensive instruction-level emulators with limited speed and restricted scalability. Furthermore, the proposed design is not bound to a specific hardware platform, a major advantage compared to existing emulators. Our evaluation shows that the proposed technique achieves a timing accuracy of 99% compared to emulation while adding only a small overhead. Concluding, it combines essential properties like accuracy, speed and scalability on a single simulation platform. fileadmin/papers/2008/2008-04-IPSN-2008-landsiedel-Timing-Matters.pdf Print IEEE Computer Society

Washington, DC, USA

Proceedings of the 7th ACM International Conference on Information Processing in Sensor Networks (IPSN 2008), St. Louis, MO, USA en 978-0-7695-3157-1 1 OlafLandsiedel Muhammad HamadAlizai KlausWehrle